MorphOPC: Advancing Mask Optimization with Multi-scale Hierarchical Morphological Learning
Quick Take
MorphOPC enhances mask optimization using multi-scale hierarchical morphological learning for improved pattern fidelity.
Key Points
- Addresses challenges in nanometer-scale circuit pattern transfer.
- Utilizes neural morphological modules for geometric transformations.
- Outperforms existing methods in printing fidelity and cost.
📖 Reader Mode
~2 min readAbstract:As feature sizes shrink to the nanometer scale, accurately transferring circuit patterns from photomasks to silicon wafers becomes increasingly challenging. Optical proximity correction (OPC) is widely used to ensure pattern fidelity and manufacturability. Recent generative mask optimization models based on encoder-decoder architecture can synthesize near-optimal masks, serving as fast machine learning (ML) surrogates for traditional OPC. However, these models often fail to capture the geometric transformations from target layouts to mask patterns, leading to suboptimal quality. In this work, we formulate mask generation as a sequence of morphological operations on local layout features and propose \textit{MorphOPC}, a multi-scale hierarchical model with neural morphological modules to learn these transformations. Experiments on edge-based OPC and ILT benchmarks across metal and via layers show that \textit{MorphOPC} consistently outperforms state-of-the-art methods, achieving higher printing fidelity and lower manufacturing cost, demonstrating strong potential for scalable mask optimization.
| Subjects: | Computer Vision and Pattern Recognition (cs.CV); Artificial Intelligence (cs.AI); Hardware Architecture (cs.AR) |
| Cite as: | arXiv:2605.12528 [cs.CV] |
| (or arXiv:2605.12528v1 [cs.CV] for this version) | |
| https://doi.org/10.48550/arXiv.2605.12528 arXiv-issued DOI via DataCite |
Submission history
From: Yuting Hu [view email]
[v1]
Mon, 13 Apr 2026 14:40:34 UTC (2,575 KB)
— Originally published at arxiv.org
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